The P-12XL is a next generation fully automatic wafer prober developed for 300mm testing. Whiel retaining the acclaimed on -axis alignment feature of previous models,the P-12XL is capable of handing reduced pad size. The system assures high-accuracy probing tests under both high and low temperature conditions. In addition,the P-12XL is equipped with a load resulting from an increasing number of probe card pins. Other features include automatic operation and standardization of system usage. The P-12XL can also be used for 200mm-wafer measurement.

●A high-accuracy and high-load resistance stage for optimal contact
●High and low temperature chuck applications
●Capable of handing CIM/FA such as AMHS
●PC-aided product type file management and remote operation
●Software compatibility with the P-8 Series probers